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Scanning Electron Microscopy Of Plastics Failure by Gottfried W. Ehrenstein, Hardcover | Indigo Chapters
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Scanning Electron Microscopy Of Plastics Failure by Gottfried W. Ehrenstein, Hardcover | Indigo Chapters
From Gottfried W. Ehrenstein
Current price: $259.99
From Gottfried W. Ehrenstein
Scanning Electron Microscopy Of Plastics Failure by Gottfried W. Ehrenstein, Hardcover | Indigo Chapters
Current price: $259.99
Loading Inventory...
Size: 0.98 x 9.41 x 1.5
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Scanning electron microscopy (SEM) is often used in plastics failure analysis when light microscopy cannot provide images of high enough resolution. SEM images also provide higher contrast, in particular of surface textures. SEM is also advantageous with very dark surfaces and transparent materials. This book is an unrivaled comprehensive collection of SEM images covering topics such as surface properties, adhesion, joining, fracture, and other types of failure of plastic parts, which are of decisive importance for the economic success of plastics manufacturing operations. | Scanning Electron Microscopy Of Plastics Failure by Gottfried W. Ehrenstein, Hardcover | Indigo Chapters